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Journal description
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Details for article 2928 of 6539 found articles
| Title: |
Link between hot electrons and interface damage in n-MOSFETs: A Monte Carlo analysis |
| Author: |
Ravaioli, U Balasubramanian, M Aktas, O |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 272 (1999) nr. 1-4 pages 4 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2928 of 6539 found articles
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